Semi-conductor device reliability evaluation and massive screening
Semi-conductor parts burn-in test
Semi-conductor device reliability evaluation and massive screening
Program Pattern Control
Convenient Inspection
AUTO / MAN Operation
Simple Interface
Wide Range of Experiment Temperature
Dew Condensation Prevention
N2 Gas Purge Function
Outstanding temperature adjusting ability by employing high precision controller with P.I.D control method with built-in auto tuning function
Can set repetition and number of times of testing condition
Can select circuit board injection method in horizontal and vertical direction
Remote solution provides functions of remote monitoring and manipulation