Environmental Test Chambers

Memory IC Burn-In Chamber

Semi-conductor device reliability evaluation and massive screening

  • Application

    Semi-conductor parts burn-in test

    Semi-conductor device reliability evaluation and massive screening

  • Features

    Program Pattern Control

    Convenient Inspection

    AUTO / MAN Operation

    Simple Interface

    Wide Range of Experiment Temperature

    Dew Condensation Prevention

    N2 Gas Purge Function

  • Merits & Characteristics

    Outstanding temperature adjusting ability by employing high precision controller with P.I.D control method with built-in auto tuning function

    Can set repetition and number of times of testing condition

    Can select circuit board injection method in horizontal and vertical direction

    Remote solution provides functions of remote monitoring and manipulation