Heat resistance trait test by applying heat stress to target sample
Test requiring drastic temperature change such as Low temperature => high temperature / high temperature => Low temperature
MIL-STD, JEDEC, IEC Specification Test
Program Pattern Control
Convenient Inspection
Long-term Continuous Operation
Simple Interface
Heavy Derrick Test
Freezing Prevention Circuit
Low Electric Power Design
Freezing Prevention Circuit
Rapid reduction of liquid quantity consumed by separating test area during testing
Can monitor status of sample under testing process by installing observation window in return system
Can use JEDEC standard tray
Web server remote monitoring service applicable